DocumentCode
921169
Title
A new transistor noise test set
Author
Ayre, Rob
Volume
60
Issue
1
fYear
1972
Firstpage
151
Lastpage
151
Abstract
An instrument is proposed for measuring the equivalent noise voltage and noise current generators of bipolar and field effect transistors. This instrument uses simple feedback networks to define the gain of the measuring system.
Keywords
Circuit noise; Circuit testing; Current measurement; Feedback; Impedance; Instruments; Noise generators; Noise measurement; Resistors; Voltage;
fLanguage
English
Journal_Title
Proceedings of the IEEE
Publisher
ieee
ISSN
0018-9219
Type
jour
DOI
10.1109/PROC.1972.8587
Filename
1450517
Link To Document