DocumentCode :
921169
Title :
A new transistor noise test set
Author :
Ayre, Rob
Volume :
60
Issue :
1
fYear :
1972
Firstpage :
151
Lastpage :
151
Abstract :
An instrument is proposed for measuring the equivalent noise voltage and noise current generators of bipolar and field effect transistors. This instrument uses simple feedback networks to define the gain of the measuring system.
Keywords :
Circuit noise; Circuit testing; Current measurement; Feedback; Impedance; Instruments; Noise generators; Noise measurement; Resistors; Voltage;
fLanguage :
English
Journal_Title :
Proceedings of the IEEE
Publisher :
ieee
ISSN :
0018-9219
Type :
jour
DOI :
10.1109/PROC.1972.8587
Filename :
1450517
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=921169
