• DocumentCode
    9216
  • Title

    A Vernier Time-to-Digital Converter With Delay Latch Chain Architecture

  • Author

    Andersson, Niklas U. ; Vesterbacka, Mark

  • Author_Institution
    Dept. of Electr. Eng., Linkoping Univ., Linkoping, Sweden
  • Volume
    61
  • Issue
    10
  • fYear
    2014
  • fDate
    Oct. 2014
  • Firstpage
    773
  • Lastpage
    777
  • Abstract
    A new Vernier time-to-digital converter (TDC) architecture using a delay line and a chain of delay latches is proposed. The delay latches replace the functionality of one delay chain and the sample register commonly found in Vernier converters, hereby enabling power and hardware efficiency improvements. The delay latches can be implemented using either standard or full custom cells, allowing the architecture to be implemented in field-programmable gate arrays, digital synthesized application specific integrated circuits, or in full custom design flows. To demonstrate the proposed concept, a 7-bit Vernier TDC has been implemented in a standard 65-nm CMOS process with an active core size of 33 μm × 120 μm. The time resolution is 5.7 ps with a power consumption of 1.75 mW measured at a conversion rate of 100 MS/s.
  • Keywords
    CMOS logic circuits; application specific integrated circuits; delay lines; field programmable gate arrays; flip-flops; time-digital conversion; Vernier time-to-digital converter; delay latch chain architecture; delay lines; digital synthesized application specific integrated circuits; field programmable gate arrays; power 1.75 mW; size 120 mum; size 33 mum; size 65 nm; word length 7 bit; CMOS integrated circuits; Delay lines; Delays; Latches; Power demand; Standards; Transistors; CMOS; Vernier; delay latch; time-to-digital converter (TDC);
  • fLanguage
    English
  • Journal_Title
    Circuits and Systems II: Express Briefs, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1549-7747
  • Type

    jour

  • DOI
    10.1109/TCSII.2014.2345289
  • Filename
    6870460