DocumentCode
9216
Title
A Vernier Time-to-Digital Converter With Delay Latch Chain Architecture
Author
Andersson, Niklas U. ; Vesterbacka, Mark
Author_Institution
Dept. of Electr. Eng., Linkoping Univ., Linkoping, Sweden
Volume
61
Issue
10
fYear
2014
fDate
Oct. 2014
Firstpage
773
Lastpage
777
Abstract
A new Vernier time-to-digital converter (TDC) architecture using a delay line and a chain of delay latches is proposed. The delay latches replace the functionality of one delay chain and the sample register commonly found in Vernier converters, hereby enabling power and hardware efficiency improvements. The delay latches can be implemented using either standard or full custom cells, allowing the architecture to be implemented in field-programmable gate arrays, digital synthesized application specific integrated circuits, or in full custom design flows. To demonstrate the proposed concept, a 7-bit Vernier TDC has been implemented in a standard 65-nm CMOS process with an active core size of 33 μm × 120 μm. The time resolution is 5.7 ps with a power consumption of 1.75 mW measured at a conversion rate of 100 MS/s.
Keywords
CMOS logic circuits; application specific integrated circuits; delay lines; field programmable gate arrays; flip-flops; time-digital conversion; Vernier time-to-digital converter; delay latch chain architecture; delay lines; digital synthesized application specific integrated circuits; field programmable gate arrays; power 1.75 mW; size 120 mum; size 33 mum; size 65 nm; word length 7 bit; CMOS integrated circuits; Delay lines; Delays; Latches; Power demand; Standards; Transistors; CMOS; Vernier; delay latch; time-to-digital converter (TDC);
fLanguage
English
Journal_Title
Circuits and Systems II: Express Briefs, IEEE Transactions on
Publisher
ieee
ISSN
1549-7747
Type
jour
DOI
10.1109/TCSII.2014.2345289
Filename
6870460
Link To Document