Method for measuring diode junction parameters as a function of current density and temperature
Author :
Howes, M.J.
Volume :
60
Issue :
3
fYear :
1972
fDate :
3/1/1972 12:00:00 AM
Firstpage :
329
Lastpage :
331
Abstract :
A simple rapid and accurate method of determining the junction parameters m and Isin the I-V relationship I = Is[exp (eV/mkT) - 1] is described, which enables their dependence on current density and temperature to be examined.
Keywords :
Circuits; Current density; Current measurement; Density measurement; Diodes; Ferrites; Frequency; RF signals; Temperature measurement; Varactors;
