• DocumentCode
    922059
  • Title

    An accurate analytical BiCMOS delay expression and its application to optimizing high-speed BiCMOS circuits

  • Author

    Fang, Wen ; Brunnschweiler, Arthur ; Ashburn, Peter

  • Author_Institution
    Dept. of Electron. & Comput. Sci., Southampton Univ., UK
  • Volume
    27
  • Issue
    2
  • fYear
    1992
  • fDate
    2/1/1992 12:00:00 AM
  • Firstpage
    191
  • Lastpage
    202
  • Abstract
    A scheme for optimizing the overall delay of BiCMOS driver circuits is proposed in this paper. Using this optimization scheme, it is found that the delay is minimized when the maximum collector current of the bipolar transistors is equal to the onset of high current effects. Using this assumption, an accurate BiCMOS delay expression is derived in terms of the bipolar and MOS device parameters. The critical device parameters are then identified and their influence on the circuit speed discussed. An overall circuit delay expression for optimizing BiCMOS buffers is derived and a comparison made with CMOS buffers. It is shown that BiCMOS circuits have a speed advantage of 1.7 or an area advantage of about 5 for 2-μm feature sizes. In order to predict the future performance of BiCMOS circuits, a figure of merit is derived from the delay expression. Using the figure-of-merit expression, it is seen that future BiCMOS circuits can keep the speed advantage over CMOS circuits down to submicrometer dimensions under constant load capacitance assumption
  • Keywords
    BIMOS integrated circuits; buffer circuits; delays; digital integrated circuits; 2 micron; BiCMOS buffers; MOS device parameters; bipolar transistors; circuit speed; constant load capacitance; delay expression; delay optimisation; high current effects; high-speed BiCMOS circuits; submicrometer dimensions; BiCMOS integrated circuits; Bipolar transistors; Capacitance; Computer science; Delay effects; Driver circuits; MOS devices; MOSFETs; Switches; Voltage;
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/4.127342
  • Filename
    127342