Title : 
Thru-Reflect-Line: An Improved Technique for Calibrating the Dual Six-Port Automatic Network Analyzer
         
        
            Author : 
Engen, Glenn F. ; Hoer, Cletus A.
         
        
        
        
        
            fDate : 
12/1/1979 12:00:00 AM
         
        
        
        
            Abstract : 
In an earlier paper, the use of a "thru-short-delay" (TSD) technique for calibrating the dual six-port automatic network analyzer was described. Another scheme required only a length of precision transmission line and a "calibration circuit." The better features of these two somewhat different approaches have now been combined and the requirement for either a known short, or a "calibration circuit" eliminated. This paper will develop the theory for this new procedure.
         
        
            Keywords : 
Calibration; Circuits; Detectors; Helium; Microwave devices; Microwave measurements; Particle measurements; Scattering parameters; Senior members; Test equipment;
         
        
        
            Journal_Title : 
Microwave Theory and Techniques, IEEE Transactions on
         
        
        
        
        
            DOI : 
10.1109/TMTT.1979.1129778