Title :
Velocity fluctuation noise in metal-semiconductor-metal diodes
Author :
Statz, H. ; Pucel, R.A. ; Haus, H.A.
fDate :
5/1/1972 12:00:00 AM
Abstract :
A noise source arising from velocity fluctuations of drifting carriers in the depletion region of the metal-semiconductor-metal (MSM) diode is identified. This source of noise adds to the shot noise and becomes prominent at high current densities, when the shot-noise contribution is small because of space-charge smoothing.
Keywords :
Acoustical engineering; Current density; Doping; Fluctuations; Impedance measurement; Noise measurement; Semiconductor device noise; Semiconductor diodes; Smoothing methods; Voltage;
Journal_Title :
Proceedings of the IEEE
DOI :
10.1109/PROC.1972.8716
