• DocumentCode
    922569
  • Title

    Analog testing with time response parameters

  • Author

    Balivada, Ashok ; Chen, Jin ; Abraham, Jacob A.

  • Author_Institution
    Center for Relativity, Texas Univ., Austin, TX, USA
  • Volume
    13
  • Issue
    2
  • fYear
    1996
  • Firstpage
    18
  • Lastpage
    25
  • Abstract
    This paper describes a simple test generation technique which derives sinusoidal test waveforms that detect several fault classes. In addition, the authors show that certain stimuli will provoke variations in delay, rise time, and overshoot that indicate faulty behavior. Simple algorithms compute the different parameters
  • Keywords
    analogue integrated circuits; fault location; analog testing; delay; fault classes; overshoot; rise time; sinusoidal test waveforms; test generation technique; time response parameters; Circuit faults; Circuit simulation; Circuit testing; Costs; Electrical fault detection; Fault detection; Time domain analysis; Time factors; Time measurement; Transfer functions;
  • fLanguage
    English
  • Journal_Title
    Design & Test of Computers, IEEE
  • Publisher
    ieee
  • ISSN
    0740-7475
  • Type

    jour

  • DOI
    10.1109/54.500197
  • Filename
    500197
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=922569