Title :
Analog testing with time response parameters
Author :
Balivada, Ashok ; Chen, Jin ; Abraham, Jacob A.
Author_Institution :
Center for Relativity, Texas Univ., Austin, TX, USA
Abstract :
This paper describes a simple test generation technique which derives sinusoidal test waveforms that detect several fault classes. In addition, the authors show that certain stimuli will provoke variations in delay, rise time, and overshoot that indicate faulty behavior. Simple algorithms compute the different parameters
Keywords :
analogue integrated circuits; fault location; analog testing; delay; fault classes; overshoot; rise time; sinusoidal test waveforms; test generation technique; time response parameters; Circuit faults; Circuit simulation; Circuit testing; Costs; Electrical fault detection; Fault detection; Time domain analysis; Time factors; Time measurement; Transfer functions;
Journal_Title :
Design & Test of Computers, IEEE
