Title :
DC built-in self-test for linear analog circuits
Author :
Chatterjee, Abhijit ; Kim, Bruce C. ; Nagi, Naveena
Author_Institution :
Georgia Inst. of Technol., Atlanta, GA, USA
Abstract :
DC testing of analog circuits is cheaper than AC testing and covers many fault classes, including some that AC tests cannot detect. This efficient, low-cost, built-in self-test (BIST) methodology uses the checksum encodings of matrix representations to uncover faults that affect a circuit´s DC transfer function
Keywords :
analogue integrated circuits; built-in self test; encoding; transfer functions; BIST; DC built-in self-test; DC transfer function; checksum encodings; fault classes; linear analog circuits; matrix representations; Analog circuits; Built-in self-test; Circuit faults; Circuit testing; Electrical fault detection; Filters; Laplace equations; Tellurium; Transfer functions; Vectors;
Journal_Title :
Design & Test of Computers, IEEE
