Title :
Real-time current testing for A/D converters
Author_Institution :
Tokyo Metropolitan Univ., Japan
Abstract :
The author has revised current testing for analog circuits, examined his method for effective fault detection, and applied it to an A/D converter. This method measures the integral of the power supply current during one clock period in which a test vector is applied. Simulation results show effective detection of target faults in the CUT when applying a step voltage input and easier detection when applying a higher power supply voltage
Keywords :
analogue integrated circuits; analogue-digital conversion; fault location; integrated circuit testing; A/D converters; analog circuits; fault detection; higher power supply voltage; power supply current; real-time current testing; simulation results; target faults; test vector; Analog circuits; Circuit testing; Clocks; Current measurement; Current supplies; Electrical fault detection; Fault detection; Power measurement; Power supplies; Voltage;
Journal_Title :
Design & Test of Computers, IEEE
