DocumentCode :
922842
Title :
Low threshold-current density in 5-layer-heterostructure (GaAl)As/GaAs localised-gain-region injection lasers
Author :
Thompson, G.H.B. ; Kirkby, P.A.
Author_Institution :
Standard Telecommunication Laboratories Ltd., Harlow, UK
Volume :
9
Issue :
13
fYear :
1973
Firstpage :
295
Lastpage :
296
Abstract :
Injection lasers have been constructed in which an active GaAs layer is sandwiched between a pair of (GaAl)As layers for carrier confinement and an outer pair of (GaAl)As layers of higher AlAs content for optical confinement. The minimum threshold-current density measured at 300 K. is 575±15 A/cm2 for 0.5 mm-long devices and 390 A/cm2 for lasers with four reflecting faces.
Keywords :
III-V semiconductors; carrier density; gallium arsenide; semiconductor lasers; carrier density; gallium arsenide; heterostructure; low threshold current density; semiconductor lasers;
fLanguage :
English
Journal_Title :
Electronics Letters
Publisher :
iet
ISSN :
0013-5194
Type :
jour
DOI :
10.1049/el:19730214
Filename :
4236159
Link To Document :
بازگشت