DocumentCode :
923420
Title :
Multiplication factors and breakdown voltages of n+--p and p+--n abrupt junctions
Author :
Spirito, P.
Author_Institution :
University of Naples, Istituto di Elettrotecnica, Napoli, Italy
Volume :
9
Issue :
16
fYear :
1973
Firstpage :
367
Lastpage :
369
Abstract :
It is shown that, in complementary n+ p and p+ n abrupt junctions for pure electron or hole multiplication, four different multiplication factors and two breakdown voltages can be defined. As an example, the four multiplication curves for a doping of 1016 cm--3, and the breakdown voltages of p+ n and n+ p abrupt Si junctions, are reported, using the multiplication data of Lee et al. and Van Overstraeten and De Man.
Keywords :
electric breakdown of solids; p-n junctions; semiconductor doping; electric breakdown of solids; multiplication factors; p-n junctions; semiconductor doping; semiconductor junctions;
fLanguage :
English
Journal_Title :
Electronics Letters
Publisher :
iet
ISSN :
0013-5194
Type :
jour
DOI :
10.1049/el:19730271
Filename :
4236219
Link To Document :
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