• DocumentCode
    923420
  • Title

    Multiplication factors and breakdown voltages of n+--p and p+--n abrupt junctions

  • Author

    Spirito, P.

  • Author_Institution
    University of Naples, Istituto di Elettrotecnica, Napoli, Italy
  • Volume
    9
  • Issue
    16
  • fYear
    1973
  • Firstpage
    367
  • Lastpage
    369
  • Abstract
    It is shown that, in complementary n+ p and p+ n abrupt junctions for pure electron or hole multiplication, four different multiplication factors and two breakdown voltages can be defined. As an example, the four multiplication curves for a doping of 1016 cm--3, and the breakdown voltages of p+ n and n+ p abrupt Si junctions, are reported, using the multiplication data of Lee et al. and Van Overstraeten and De Man.
  • Keywords
    electric breakdown of solids; p-n junctions; semiconductor doping; electric breakdown of solids; multiplication factors; p-n junctions; semiconductor doping; semiconductor junctions;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19730271
  • Filename
    4236219