DocumentCode
923420
Title
Multiplication factors and breakdown voltages of n+--p and p+--n abrupt junctions
Author
Spirito, P.
Author_Institution
University of Naples, Istituto di Elettrotecnica, Napoli, Italy
Volume
9
Issue
16
fYear
1973
Firstpage
367
Lastpage
369
Abstract
It is shown that, in complementary n+ p and p+ n abrupt junctions for pure electron or hole multiplication, four different multiplication factors and two breakdown voltages can be defined. As an example, the four multiplication curves for a doping of 1016 cm--3, and the breakdown voltages of p+ n and n+ p abrupt Si junctions, are reported, using the multiplication data of Lee et al. and Van Overstraeten and De Man.
Keywords
electric breakdown of solids; p-n junctions; semiconductor doping; electric breakdown of solids; multiplication factors; p-n junctions; semiconductor doping; semiconductor junctions;
fLanguage
English
Journal_Title
Electronics Letters
Publisher
iet
ISSN
0013-5194
Type
jour
DOI
10.1049/el:19730271
Filename
4236219
Link To Document