Author_Institution :
University of Naples, Istituto di Elettrotecnica, Napoli, Italy
Abstract :
It is shown that, in complementary n+ p and p+ n abrupt junctions for pure electron or hole multiplication, four different multiplication factors and two breakdown voltages can be defined. As an example, the four multiplication curves for a doping of 1016 cm--3, and the breakdown voltages of p+ n and n+ p abrupt Si junctions, are reported, using the multiplication data of Lee et al. and Van Overstraeten and De Man.