DocumentCode :
923556
Title :
Microplasma Trapping of Particles
Author :
Xue, Jun ; Hopwood, Jeffrey A.
Author_Institution :
Tufts Univ., Medford
Volume :
35
Issue :
5
fYear :
2007
Firstpage :
1574
Lastpage :
1579
Abstract :
The localized potential gradients created by a microplasma are capable of trapping and concentrating micro- and nanoparticles. In this paper, argon microplasma is generated within a 350-mum discharge gap formed within a microstrip transmission line. Melamine formaldehyde particles (1 mum) are released approximately 2 cm away from the microplasma. The microparticles are then negatively charged by stray electrons, electrostatically drawn toward the potential well of the microplasma, and trapped within the microplasma. The particles are observed to form Coulomb crystals. Time-of-flight experiments show that the particles are trapped in the microplasma by balancing the electrostatic force of the potential well against the molecular drag force. Pulsed plasma data show that the particles retain a net negative charge after the plasma has been extinguished, allowing detection and sorting by electrostatic methods.
Keywords :
discharges (electric); electrostatics; ion density; nanoparticles; organic compounds; particle traps; plasma applications; Coulomb crystals; discharge gap; electrostatic force; ion density; localized potential gradients; melamine formaldehyde particles; microparticles; microplasma trapping; microstrip transmission line; molecular drag force; nanoparticles; plasma sheath; potential well; time-of-flight experiments; Argon; Crystals; Drag; Electron traps; Electrostatics; Microstrip; Nanoparticles; Plasmas; Potential well; Transmission lines; Dusty plasma; microparticle; microplasma;
fLanguage :
English
Journal_Title :
Plasma Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0093-3813
Type :
jour
DOI :
10.1109/TPS.2007.905210
Filename :
4343202
Link To Document :
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