Title :
Overlapping-gate buried-channel charge-coupled devices
Author :
Mohsen, A.M. ; Bower, R. ; McGill, T.C. ; Zimmerman, Tom
Author_Institution :
California Institute of Technology, Pasadena, USA
Abstract :
In this letter the advantages of the overlapping-gate buried-channel charged-coupled devices over the 3-phase metal-gate and resistive-gate buried-channel c.c.d. are discussed and pertinent design considerations for the overlapping-gate c.c.d.s are presented.
Keywords :
charge-coupled devices; charge coupled devices; overlapping gate buried channel;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19730293
