• DocumentCode
    923799
  • Title

    Determination of Thickness and Dielectric Constant of Coatings from Capacitance Measurements

  • Author

    Guadarrama-Santana, A. ; García-Valenzuela, A.

  • Author_Institution
    Univ. Nacional Autonoma de Mexico, Mexico City
  • Volume
    10
  • Issue
    5
  • fYear
    2007
  • fDate
    10/1/2007 12:00:00 AM
  • Firstpage
    26
  • Lastpage
    31
  • Abstract
    In this work, we deal only with the case of a uniform dielectric film on top of a flat conductor. Our goal is to demonstrate the possibility to measure the thickness and dielectric constant of the dielectric coating by capacitance measurements in a nondestructive way and to estimate the resolution of this technique.
  • Keywords
    capacitance measurement; dielectric thin films; nondestructive testing; permittivity measurement; thickness measurement; capacitance measurements; dielectric coatings; dielectric constant; dielectric film; nondestructive technique; thickness determination; Capacitance measurement; Coatings; Dielectric constant; Dielectric measurements; Dielectric substrates; Electrodes; Instruments; Optical sensors; Thickness measurement; Ultrafast optics;
  • fLanguage
    English
  • Journal_Title
    Instrumentation & Measurement Magazine, IEEE
  • Publisher
    ieee
  • ISSN
    1094-6969
  • Type

    jour

  • DOI
    10.1109/MIM.2007.4343564
  • Filename
    4343564
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=923799