DocumentCode :
923921
Title :
Numerical and experimental investigation of radiation caused by the switching noise on the partitioned DC reference planes of high speed digital PCB
Author :
Wu, Tzong-Lin ; Chen, Sin-Ting ; Hwang, Jiunn-Nan ; Lin, Yen-Hui
Author_Institution :
Dept. of Electr. of Eng., Nat. Sun Yat-sen Univ., Taiwan, Taiwan
Volume :
46
Issue :
1
fYear :
2004
Firstpage :
33
Lastpage :
45
Abstract :
Influence of the partitioning and bridging of the power/ground planes on the radiation caused by the switching noise on the dc reference planes is investigated both theoretically and experimentally. Based on the three-dimensional finite-difference time-domain modeling, the electromagnetic interference (EMI) performance of the partitioned power/ground planes is studied. Radiated emission at the 3-m distance from the tested boards is measured in a fully anechoic chamber. The measured and the numerical results agree generally well. The radiation behavior of four kinds of partitioned configuration of the power/ground planes is studied. It is found that completely isolating the noise source by the etched slits, or moats, significantly reduces the radiation level at the frequencies near resonance. However, bridges connecting two sides of the moat not only significantly degrade the ability of the EMI protection of the moat, but also excite a new low-frequency resonant mode. The effect of the geometrical parameters, such as the moat size, moat location, bridge width, and bridge position, on the radiation behavior of the printed circuit board is considered. The radiation mechanism of the EMI behavior of the partitioned dc reference planes is discussed.
Keywords :
bridge circuits; circuit noise; electromagnetic interference; finite difference time-domain analysis; printed circuits; 3 m; 3D finite-difference time-domain modeling; bridging; electromagnetic interference performance; geometrical parameters; high speed digital printed circuit board; noise source isolation; partitioned dc reference planes; power/ground planes; radiated emission; radiation behavior; radiation level reduction; radiation mechanism; simultaneously switching noise; Anechoic chambers; Bridge circuits; Electromagnetic interference; Electromagnetic measurements; Electromagnetic modeling; Finite difference methods; Noise reduction; Resonance; Testing; Time domain analysis;
fLanguage :
English
Journal_Title :
Electromagnetic Compatibility, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9375
Type :
jour
DOI :
10.1109/TEMC.2004.823680
Filename :
1273610
Link To Document :
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