Title :
Plane-Wave Interaction with Structures of Thin Absorbing Films (Short Papers)
Author :
Hartnagel, Hans L.
fDate :
6/1/1980 12:00:00 AM
Abstract :
Electromagnetic plane-wave absorption by resistive films of finite dimensions are considered. It is proposed that the effect of edge diffraction from a finite film causes the experimentally observed frecuency-dependent sensitivity of thin-film microwave-power monitors. Methods are outlined to prevent such frecuency dispersion. It is pointed out that the position of a microwave power source can be determined by 3 pairs of perpendicularly placed thin-film monitors.
Keywords :
Capacitance; Coaxial components; Conductors; Electromagnetic wave absorption; Frequency; Impedance; Microwave Theory and Techniques Society; Microwave theory and techniques; Optical films; Transistors;
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
DOI :
10.1109/TMTT.1980.1130137
