DocumentCode :
924709
Title :
Charging of spacecraft materials simulated in a scanning electron microscope
Author :
Balmain, K.G.
Author_Institution :
University of Toronto, Department of Electrical Engineering, Toronto, Canada
Volume :
9
Issue :
23
fYear :
1973
Firstpage :
544
Lastpage :
546
Abstract :
The scanning electron microscope has been used to apply electric charge to spacecraft insulating materials, and to photograph the resulting patterns of charge distribution. Anomalies, possibly microscopic discharges, have been observed, usually associated with strong differential charging between adjacent regions of the same material. In thin materials, electron-beam penetration, temporarily induced conductivity and permanent subsurface damage have been identified.
Keywords :
electric charge; electron microscope examination of materials; insulating materials; space vehicles; charge distribution; electric charge; electron microscope examination of materials; insulating materials; scanning electron microscope; space vehicles; spacecraft materials;
fLanguage :
English
Journal_Title :
Electronics Letters
Publisher :
iet
ISSN :
0013-5194
Type :
jour
DOI :
10.1049/el:19730401
Filename :
4236356
Link To Document :
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