Title :
Charging of spacecraft materials simulated in a scanning electron microscope
Author_Institution :
University of Toronto, Department of Electrical Engineering, Toronto, Canada
Abstract :
The scanning electron microscope has been used to apply electric charge to spacecraft insulating materials, and to photograph the resulting patterns of charge distribution. Anomalies, possibly microscopic discharges, have been observed, usually associated with strong differential charging between adjacent regions of the same material. In thin materials, electron-beam penetration, temporarily induced conductivity and permanent subsurface damage have been identified.
Keywords :
electric charge; electron microscope examination of materials; insulating materials; space vehicles; charge distribution; electric charge; electron microscope examination of materials; insulating materials; scanning electron microscope; space vehicles; spacecraft materials;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19730401