• DocumentCode
    924709
  • Title

    Charging of spacecraft materials simulated in a scanning electron microscope

  • Author

    Balmain, K.G.

  • Author_Institution
    University of Toronto, Department of Electrical Engineering, Toronto, Canada
  • Volume
    9
  • Issue
    23
  • fYear
    1973
  • Firstpage
    544
  • Lastpage
    546
  • Abstract
    The scanning electron microscope has been used to apply electric charge to spacecraft insulating materials, and to photograph the resulting patterns of charge distribution. Anomalies, possibly microscopic discharges, have been observed, usually associated with strong differential charging between adjacent regions of the same material. In thin materials, electron-beam penetration, temporarily induced conductivity and permanent subsurface damage have been identified.
  • Keywords
    electric charge; electron microscope examination of materials; insulating materials; space vehicles; charge distribution; electric charge; electron microscope examination of materials; insulating materials; scanning electron microscope; space vehicles; spacecraft materials;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19730401
  • Filename
    4236356