DocumentCode
924709
Title
Charging of spacecraft materials simulated in a scanning electron microscope
Author
Balmain, K.G.
Author_Institution
University of Toronto, Department of Electrical Engineering, Toronto, Canada
Volume
9
Issue
23
fYear
1973
Firstpage
544
Lastpage
546
Abstract
The scanning electron microscope has been used to apply electric charge to spacecraft insulating materials, and to photograph the resulting patterns of charge distribution. Anomalies, possibly microscopic discharges, have been observed, usually associated with strong differential charging between adjacent regions of the same material. In thin materials, electron-beam penetration, temporarily induced conductivity and permanent subsurface damage have been identified.
Keywords
electric charge; electron microscope examination of materials; insulating materials; space vehicles; charge distribution; electric charge; electron microscope examination of materials; insulating materials; scanning electron microscope; space vehicles; spacecraft materials;
fLanguage
English
Journal_Title
Electronics Letters
Publisher
iet
ISSN
0013-5194
Type
jour
DOI
10.1049/el:19730401
Filename
4236356
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