DocumentCode :
924803
Title :
Implications for Entry Level Test Professionals
Author :
Grubbs, Albert B., Jr.
Author_Institution :
Texas A&M University, College Station, Texas 77840-3367
Volume :
1
Issue :
7
fYear :
1986
fDate :
7/1/1986 12:00:00 AM
Firstpage :
2
Lastpage :
5
Abstract :
This paper discusses the product and manufacturing trends that are currently impacting the testing function. In addition, since educational experiences relevant to testing is minimal at most universities, the impact of current and future trends in testing are noted.
Keywords :
Application specific integrated circuits; Circuit testing; Consumer electronics; Costs; Design engineering; Electronic equipment manufacture; Electronic equipment testing; Logic testing; Pins; Surface-mount technology;
fLanguage :
English
Journal_Title :
Aerospace and Electronic Systems Magazine, IEEE
Publisher :
ieee
ISSN :
0885-8985
Type :
jour
DOI :
10.1109/MAES.1986.5005152
Filename :
5005152
Link To Document :
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