Title :
Implications for Entry Level Test Professionals
Author :
Grubbs, Albert B., Jr.
Author_Institution :
Texas A&M University, College Station, Texas 77840-3367
fDate :
7/1/1986 12:00:00 AM
Abstract :
This paper discusses the product and manufacturing trends that are currently impacting the testing function. In addition, since educational experiences relevant to testing is minimal at most universities, the impact of current and future trends in testing are noted.
Keywords :
Application specific integrated circuits; Circuit testing; Consumer electronics; Costs; Design engineering; Electronic equipment manufacture; Electronic equipment testing; Logic testing; Pins; Surface-mount technology;
Journal_Title :
Aerospace and Electronic Systems Magazine, IEEE
DOI :
10.1109/MAES.1986.5005152
