• DocumentCode
    924803
  • Title

    Implications for Entry Level Test Professionals

  • Author

    Grubbs, Albert B., Jr.

  • Author_Institution
    Texas A&M University, College Station, Texas 77840-3367
  • Volume
    1
  • Issue
    7
  • fYear
    1986
  • fDate
    7/1/1986 12:00:00 AM
  • Firstpage
    2
  • Lastpage
    5
  • Abstract
    This paper discusses the product and manufacturing trends that are currently impacting the testing function. In addition, since educational experiences relevant to testing is minimal at most universities, the impact of current and future trends in testing are noted.
  • Keywords
    Application specific integrated circuits; Circuit testing; Consumer electronics; Costs; Design engineering; Electronic equipment manufacture; Electronic equipment testing; Logic testing; Pins; Surface-mount technology;
  • fLanguage
    English
  • Journal_Title
    Aerospace and Electronic Systems Magazine, IEEE
  • Publisher
    ieee
  • ISSN
    0885-8985
  • Type

    jour

  • DOI
    10.1109/MAES.1986.5005152
  • Filename
    5005152
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=924803