Title :
On the probability of error and the expected Bhattacharyya distance in multiclass pattern recognition
Author_Institution :
Univ. California, Irvine, Calif.
Abstract :
A relationship between the probability of misrecognition and the expected Bhattacharyya distance is examined, and it is shown that the maximization of the mean Bhattacharyya distance minimizes an upper bound on the error probability.
Keywords :
Bayesian methods; Circuit stability; Diodes; Frequency; Oscillators; Pattern recognition; Petroleum; Stability criteria; Upper bound;
Journal_Title :
Proceedings of the IEEE
DOI :
10.1109/PROC.1972.8928
