Title :
Optimization of InP-InGaAs HPT gain: design of an opto-microwave monolithic amplifier
Author :
Polleux, Jean-Luc ; Paszkiewicz, Laurent ; Billabert, Anne-Laure ; Salset, Jacques ; Rumelhard, Christian
Author_Institution :
Equipe Systemes de Commun. et Microsystemes (ESYCOM) Lab., Noisy-Le-Grand, France
fDate :
3/1/2004 12:00:00 AM
Abstract :
We have designed an opto-microwave monolithic amplifier with emphasis on the definition of the opto-microwave power gain. First, we present physical simulations of an InP-InGaAs heterostructure phototransistor (HPT), which enable the structural analysis of the composition and behavior of the phototransistor. From these simulations and from both electrical and optical measurements, we next established a large-signal model, which adds photoelectric effect to an HBT model. Small-signal opto-microwave S-parameters of the HPT are first defined and then related to the small-signal opto-microwave power gain of the phototransistor. Relations are given to enable optimum loads on the base and collector ports to be found so that the opto-microwave gain can be optimized. An opto-microwave amplifier is then designed, realized, and measured with a setup based on the beating of two lasers.
Keywords :
III-V semiconductors; MMIC amplifiers; S-parameters; bipolar MMIC; gallium arsenide; indium compounds; integrated optoelectronics; microwave photonics; optical receivers; phototransistors; semiconductor device models; InP-InGaAs; S-parameters; bipolar phototransistor; heterostructure phototransistor gain; large-signal model; nonlinear modified Ebers-Moll model; numerical simulation; optimum loads; opto-microwave monolithic amplifier; opto-microwave power gain; photoelectric effect; photoreceiver; phototransistor modeling; Analytical models; Design optimization; Electric variables measurement; Heterojunction bipolar transistors; Optical amplifiers; Phototransistors; Photovoltaic effects; Power amplifiers; Scattering parameters; Stimulated emission;
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
DOI :
10.1109/TMTT.2004.823555