• DocumentCode
    925552
  • Title

    Microwave Measurement of Conductivity and Permittivity of Semiconductor Spheres by Cavity Perturbation Technique

  • Author

    Mansingh, Abhai ; Parkash, Anand

  • Volume
    29
  • Issue
    1
  • fYear
    1981
  • fDate
    1/1/1981 12:00:00 AM
  • Firstpage
    62
  • Lastpage
    65
  • Abstract
    Simple analytical relations for evaluating the components of complex relative permittivity of semiconductors using a cavity perturbation technique for spherical samples are presented. The relations although derived under a simplifying approximation yield remits of almost the same accuracy obtained by computer solutions of a transcendental equation for samples with resistivity up to about 1Omega-cm.
  • Keywords
    Conductivity measurement; Dielectric loss measurement; Dielectric measurements; Equations; Extraterrestrial measurements; Loss measurement; Microwave measurements; Microwave theory and techniques; Permittivity measurement; Perturbation methods;
  • fLanguage
    English
  • Journal_Title
    Microwave Theory and Techniques, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9480
  • Type

    jour

  • DOI
    10.1109/TMTT.1981.1130288
  • Filename
    1130288
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=925552