Title :
Extension of Boolean differentiation to define a test for a specific logic fault in a combinational logic network
Author_Institution :
University of Southampton, Department of Electronics, Southampton, UK
Abstract :
The letter demonstrates an extension of Boolean difference to obtain a test for a specific fault. The extension is compared with Roth´s D calculus, and it is shown that the two concepts are complementary. A procedure for determining the total fault-detection capability of each test is indicated.
Keywords :
combinatorial circuits; fault tolerant computing; Roth´s D calculus; combinational logic network; extension of Boolean differentiation; logic fault testing; specific logic fault; total fault detection capability determination;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19740280
