Title :
On the maximization of divergence in pattern recognition (Corresp.)
Author :
Chittineni, C.B.
fDate :
9/1/1976 12:00:00 AM
Abstract :
This correspondence considers the problem of maximization of the divergence between a pair of unequal mean and unequal covariance matrix Gaussian distributed pattern classes. The original pattern space is transformed into a new space such that the sum of the covariance matrices is a unit matrix. From this relationship, a set of orthonormal directions are obtained sequentially such that, when the patterns are projected onto each of these directions, the divergence between the pattern classes is maximized.
Keywords :
Feature extraction; Pattern classification; Covariance matrix; Density functional theory; Feature extraction; Linear matrix inequalities; Pattern recognition; Statistical analysis; Statistical distributions; Testing;
Journal_Title :
Information Theory, IEEE Transactions on
DOI :
10.1109/TIT.1976.1055606