Title :
Base spreading resistance of square-emitter transistors and its dependence on current crowding
Author :
Rein, H. ; Schroter, M.
Author_Institution :
Inst. fuer Electron., Ruhr-Univ., Bochum, West Germany
fDate :
4/1/1989 12:00:00 AM
Abstract :
The internal DC and small-signal low-frequency base-spreading resistances of a square-emitter transistor have been calculated analytically as a function of base current. Simplifying assumptions result in a nonlinear differential equation with a simple explicit solution. The validity of the assumptions has been checked by exact numerical device simulation. The error of the analytical approximation has a maximum of only 11% at negligible current crowding (rBi-rBi,0=rs /32 instead of the exact value rs/28.6). In the total operating range of interest, the error of the analytical expression for rBi can be dropped to negligible values if the exact value of rBi,0 is inserted
Keywords :
bipolar transistors; nonlinear differential equations; analytical expression; base current; current crowding; internal DC; nonlinear differential equation; small-signal low-frequency base-spreading resistances; square-emitter transistors; Bipolar transistors; Differential equations; Doping; Electron devices; Error analysis; Nuclear magnetic resonance; Numerical simulation; Photonic band gap; Proximity effect; Semiconductor impurities;
Journal_Title :
Electron Devices, IEEE Transactions on