DocumentCode :
925988
Title :
Second breakdown of transistors during inductive turnoff
Author :
Krishna, Sanjay ; Hower, P.L.
Volume :
61
Issue :
3
fYear :
1973
fDate :
3/1/1973 12:00:00 AM
Firstpage :
393
Lastpage :
395
Abstract :
During turnoff, current is localized to the center of the emitter stripe of a transistor. Depending on the magnitude of reverse base current and device parameters, the current density can reach levels which trigger avalanche injection. A simple model is presented which describes this effect and shows good agreement with measurements.
Keywords :
Acoustical engineering; Current density; Electric breakdown; Frequency measurement; Gallium arsenide; Laboratories; Noise measurement; Schottky barriers; Schottky diodes; Temperature measurement;
fLanguage :
English
Journal_Title :
Proceedings of the IEEE
Publisher :
ieee
ISSN :
0018-9219
Type :
jour
DOI :
10.1109/PROC.1973.9044
Filename :
1450974
Link To Document :
بازگشت