Title :
Control of scattering from probes for near-field antenna measurements by use of skirt
Author :
Frandsen, A. ; Pivnenko, S. ; Breinbjerg, O.
Author_Institution :
TICRA, Copenhagen, Denmark
fDate :
3/4/2004 12:00:00 AM
Abstract :
A novel approach to reducing the multiple reflections between the test antenna and the probe in near-field antenna measurements is proposed. Instead of absorbers, this approach makes use of a skirt on the probe to shield against the mounting structure behind the probe.
Keywords :
antenna radiation patterns; antenna testing; electromagnetic wave scattering; probes; 20 GHz; 30 GHz; antenna measurements; antenna radiation patterns; antenna testing; antenna under test; mounting structure; multiple reflections; probes; scattering; skirt;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:20040179
