• DocumentCode
    926041
  • Title

    Control of scattering from probes for near-field antenna measurements by use of skirt

  • Author

    Frandsen, A. ; Pivnenko, S. ; Breinbjerg, O.

  • Author_Institution
    TICRA, Copenhagen, Denmark
  • Volume
    40
  • Issue
    5
  • fYear
    2004
  • fDate
    3/4/2004 12:00:00 AM
  • Firstpage
    284
  • Lastpage
    285
  • Abstract
    A novel approach to reducing the multiple reflections between the test antenna and the probe in near-field antenna measurements is proposed. Instead of absorbers, this approach makes use of a skirt on the probe to shield against the mounting structure behind the probe.
  • Keywords
    antenna radiation patterns; antenna testing; electromagnetic wave scattering; probes; 20 GHz; 30 GHz; antenna measurements; antenna radiation patterns; antenna testing; antenna under test; mounting structure; multiple reflections; probes; scattering; skirt;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:20040179
  • Filename
    1273922