Title :
Linear sum codes for random access memories
Author :
Fuja, Tom ; Heegard, Chris ; Goodman, Rod
Author_Institution :
Dept. of Electr. Eng., Maryland Univ., College Park, MD, USA
fDate :
9/1/1988 12:00:00 AM
Abstract :
Linear sum codes (LSCs) form a class of error control codes designed to provide on-chip error correction to semiconductor random access memories (RAMs). They use the natural addressing scheme found on RAMs to form and access codewords with a minimum of overhead. The authors formally define linear sum codes and examine some of their characteristics. Specifically, they examine their minimum distance characteristics, their error correcting capabilities, and the complexity involved in their implementation. In addition, detailed consideration is given to an easily implemented class of single-, double-, and triple-error correcting LSCs
Keywords :
error correction codes; random-access storage; LSCs; error control codes; error correcting; linear sum codes; on-chip error correction; random access memories; semiconductor random access memories; Block codes; Control systems; Error correction; Error correction codes; Fault tolerance; Parity check codes; Random access memory; Read-write memory; Redundancy; Semiconductor memory;
Journal_Title :
Computers, IEEE Transactions on