DocumentCode
926498
Title
Fused Impurity P-N-P Junction Transistors
Author
Saby, John S.
Author_Institution
Electronics Laboratory, General Electric Co., Syracuse, N.Y.
Volume
40
Issue
11
fYear
1952
Firstpage
1358
Lastpage
1360
Abstract
Fused impurity p-n-p junction transistors have been made which exhibit the useful circuit characteristics of high-gain, low-noise figure and alpha slightly less than unity. Such transistors are well adapted for application involving high ambient temperatures or high dissipation levels since alpha remains very nearly constant up to 120 degrees C and decreases somewhat above this temperature, permitting their stable use in emitter-grounded circuits at high temperatures. This is in contrast to junction transistors having high-resistivity collector regions, for which alpha often rises above unity at high temperatures leading to circuit instability. Satisfactory operation at several watts collector dissipation has been achieved.
Keywords
Circuits; Fabrication; Germanium; Marine vehicles; P-n junctions; Power dissipation; Semiconductor device modeling; Semiconductor impurities; Signal processing; Temperature;
fLanguage
English
Journal_Title
Proceedings of the IRE
Publisher
ieee
ISSN
0096-8390
Type
jour
DOI
10.1109/JRPROC.1952.273962
Filename
4050834
Link To Document