• DocumentCode
    926498
  • Title

    Fused Impurity P-N-P Junction Transistors

  • Author

    Saby, John S.

  • Author_Institution
    Electronics Laboratory, General Electric Co., Syracuse, N.Y.
  • Volume
    40
  • Issue
    11
  • fYear
    1952
  • Firstpage
    1358
  • Lastpage
    1360
  • Abstract
    Fused impurity p-n-p junction transistors have been made which exhibit the useful circuit characteristics of high-gain, low-noise figure and alpha slightly less than unity. Such transistors are well adapted for application involving high ambient temperatures or high dissipation levels since alpha remains very nearly constant up to 120 degrees C and decreases somewhat above this temperature, permitting their stable use in emitter-grounded circuits at high temperatures. This is in contrast to junction transistors having high-resistivity collector regions, for which alpha often rises above unity at high temperatures leading to circuit instability. Satisfactory operation at several watts collector dissipation has been achieved.
  • Keywords
    Circuits; Fabrication; Germanium; Marine vehicles; P-n junctions; Power dissipation; Semiconductor device modeling; Semiconductor impurities; Signal processing; Temperature;
  • fLanguage
    English
  • Journal_Title
    Proceedings of the IRE
  • Publisher
    ieee
  • ISSN
    0096-8390
  • Type

    jour

  • DOI
    10.1109/JRPROC.1952.273962
  • Filename
    4050834