Title :
Dynamics of Transistor Negative-Resistance Circuits
Author_Institution :
Bell Telephone Laboratories, Murray Hill Laboratory, Murray Hill, N.J.
Abstract :
A general method is presented for calculating approximately the behavior of many nonlinear circuits by dividing the region of operation into subregions, within each of which the circuit may be considered linear to a good approximation. The method is applied to a high-speed transistor switching circuit as an illustrative example.
Keywords :
Circuit analysis; Control systems; Genetic expression; Impedance; Laboratories; Linear circuits; Nonlinear circuits; Pulse circuits; Switching circuits; Voltage;
Journal_Title :
Proceedings of the IRE
DOI :
10.1109/JRPROC.1952.273988
