• DocumentCode
    926958
  • Title

    Use of specific emitter efficiency in evaluation and design of bipolar transistors

  • Author

    Saltich, J.L. ; Volk, C.E. ; Clark, L.E.

  • Author_Institution
    Motorola, Inc., Phoenix, Ariz.
  • Volume
    61
  • Issue
    5
  • fYear
    1973
  • fDate
    5/1/1973 12:00:00 AM
  • Firstpage
    680
  • Lastpage
    681
  • Abstract
    This letter presents experimental data which extend the concept of specific emitter efficiency as a determinant of current gain to its effect on the ancillary device parameter of subemitter base sheet resistance. This is important, for example, in predicting pinch resistor values and in evaluating current-crowding effects.
  • Keywords
    Baseband; Bipolar transistors; Current measurement; Cutoff frequency; Distortion; Filtering; Filters; Sampling methods; Signal sampling; Transfer functions;
  • fLanguage
    English
  • Journal_Title
    Proceedings of the IEEE
  • Publisher
    ieee
  • ISSN
    0018-9219
  • Type

    jour

  • DOI
    10.1109/PROC.1973.9139
  • Filename
    1451069