Title :
Single-Frequency Analysis of Radial and Planar Amplifier Combiner Circuits
Author :
Galani, Zvi ; Lampen, James L. ; Temple, Steven J.
fDate :
7/1/1981 12:00:00 AM
Abstract :
A single-frequency analysis of radial and planar amplifier combiner circuits is presented and expresses the dependence of amplifier combiner performance on the scattering parameters of the amplifiers and combiner/divider networks. The analysis results in useful design guidelines to achieve optimum performance for small variations in amplifier parameters and graceful degradation under the condition of amplifier failure. Several examples are presented to verify the accuracy of the derived expressions. The scattering matrices of radial and planar combiner/ divider networks are derived in the Appendix.
Keywords :
Circuits; Conference proceedings; FETs; Failure analysis; Gallium arsenide; Metallization; NIST; Physics; Power amplifiers; Testing;
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
DOI :
10.1109/TMTT.1981.1130423