• DocumentCode
    926985
  • Title

    Single-Frequency Analysis of Radial and Planar Amplifier Combiner Circuits

  • Author

    Galani, Zvi ; Lampen, James L. ; Temple, Steven J.

  • Volume
    29
  • Issue
    7
  • fYear
    1981
  • fDate
    7/1/1981 12:00:00 AM
  • Firstpage
    642
  • Lastpage
    654
  • Abstract
    A single-frequency analysis of radial and planar amplifier combiner circuits is presented and expresses the dependence of amplifier combiner performance on the scattering parameters of the amplifiers and combiner/divider networks. The analysis results in useful design guidelines to achieve optimum performance for small variations in amplifier parameters and graceful degradation under the condition of amplifier failure. Several examples are presented to verify the accuracy of the derived expressions. The scattering matrices of radial and planar combiner/ divider networks are derived in the Appendix.
  • Keywords
    Circuits; Conference proceedings; FETs; Failure analysis; Gallium arsenide; Metallization; NIST; Physics; Power amplifiers; Testing;
  • fLanguage
    English
  • Journal_Title
    Microwave Theory and Techniques, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9480
  • Type

    jour

  • DOI
    10.1109/TMTT.1981.1130423
  • Filename
    1130423