DocumentCode
927
Title
A Wideband Power Amplifier in 45 nm CMOS SOI Technology for X Band Applications
Author
Jing-Hwa Chen ; Helmi, S.R. ; Jou, Alice Yi-Szu ; Mohammadi, Soheil
Author_Institution
Birck Nanotechnol. Center, Purdue Univ., West Lafayette, IN, USA
Volume
23
Issue
11
fYear
2013
fDate
Nov. 2013
Firstpage
587
Lastpage
589
Abstract
A fully-integrated wideband power amplifier (PA) operating in 9-15 GHz range is implemented in a standard 45 nm CMOS SOI technology. The PA is designed with three dynamically-biased stacked Cascode cells (6 stacked transistors) to overcome the low breakdown voltages of nanoscale CMOS transistors. The stacked Cascode cells ensure stable operation and facilitate high gain, and high optimum load impedance, leading to high output power, high efficiency and good linearity characteristics over the entire bandwidth. The unbalanced amplitude and phase of drain-source voltage signals caused by internodal parasitic capacitance are equalized by adjusting the sizing of transistors. With a supply voltage of 4.8 V at 12 GHz, the measured saturated output power and linear power are 22.5 dBm and 19.2 dBm, respectively, while the peak power-added efficiency (PAE) is 19.2%. At a reduced power supply of 3.6 V, the PA achieves peak PAE of 25.7% where the drain efficiency reaches 40.7%. Including its pads, the PA occupies a compact chip area of 0.22 mm2.
Keywords
CMOS analogue integrated circuits; MMIC power amplifiers; elemental semiconductors; field effect MMIC; silicon-on-insulator; wideband amplifiers; X-band application; breakdown voltages; drain efficiency; drain-source voltage signals; dynamically-biased stacked cascode cells; efficiency 19.2 percent; efficiency 25.7 percent; efficiency 40.7 percent; frequency 9 GHz to 15 GHz; fully-integrated wideband PA; fully-integrated wideband power amplifier; internodal parasitic capacitance; linear power; linearity characteristics; measured saturated output power; nanoscale CMOS transistors; peak power-added efficiency; size 45 nm; stacked cascode cells; standard CMOS SOI technology; transistor sizing; voltage 3.6 V; voltage 4.8 V; Breakdown voltage; CMOS integrated circuits; CMOS technology; Impedance; Power generation; Transistors; Wideband; CMOS; RF power amplifier (PA); SOI; X band; stacked;
fLanguage
English
Journal_Title
Microwave and Wireless Components Letters, IEEE
Publisher
ieee
ISSN
1531-1309
Type
jour
DOI
10.1109/LMWC.2013.2279117
Filename
6590030
Link To Document