• DocumentCode
    927
  • Title

    A Wideband Power Amplifier in 45 nm CMOS SOI Technology for X Band Applications

  • Author

    Jing-Hwa Chen ; Helmi, S.R. ; Jou, Alice Yi-Szu ; Mohammadi, Soheil

  • Author_Institution
    Birck Nanotechnol. Center, Purdue Univ., West Lafayette, IN, USA
  • Volume
    23
  • Issue
    11
  • fYear
    2013
  • fDate
    Nov. 2013
  • Firstpage
    587
  • Lastpage
    589
  • Abstract
    A fully-integrated wideband power amplifier (PA) operating in 9-15 GHz range is implemented in a standard 45 nm CMOS SOI technology. The PA is designed with three dynamically-biased stacked Cascode cells (6 stacked transistors) to overcome the low breakdown voltages of nanoscale CMOS transistors. The stacked Cascode cells ensure stable operation and facilitate high gain, and high optimum load impedance, leading to high output power, high efficiency and good linearity characteristics over the entire bandwidth. The unbalanced amplitude and phase of drain-source voltage signals caused by internodal parasitic capacitance are equalized by adjusting the sizing of transistors. With a supply voltage of 4.8 V at 12 GHz, the measured saturated output power and linear power are 22.5 dBm and 19.2 dBm, respectively, while the peak power-added efficiency (PAE) is 19.2%. At a reduced power supply of 3.6 V, the PA achieves peak PAE of 25.7% where the drain efficiency reaches 40.7%. Including its pads, the PA occupies a compact chip area of 0.22 mm2.
  • Keywords
    CMOS analogue integrated circuits; MMIC power amplifiers; elemental semiconductors; field effect MMIC; silicon-on-insulator; wideband amplifiers; X-band application; breakdown voltages; drain efficiency; drain-source voltage signals; dynamically-biased stacked cascode cells; efficiency 19.2 percent; efficiency 25.7 percent; efficiency 40.7 percent; frequency 9 GHz to 15 GHz; fully-integrated wideband PA; fully-integrated wideband power amplifier; internodal parasitic capacitance; linear power; linearity characteristics; measured saturated output power; nanoscale CMOS transistors; peak power-added efficiency; size 45 nm; stacked cascode cells; standard CMOS SOI technology; transistor sizing; voltage 3.6 V; voltage 4.8 V; Breakdown voltage; CMOS integrated circuits; CMOS technology; Impedance; Power generation; Transistors; Wideband; CMOS; RF power amplifier (PA); SOI; X band; stacked;
  • fLanguage
    English
  • Journal_Title
    Microwave and Wireless Components Letters, IEEE
  • Publisher
    ieee
  • ISSN
    1531-1309
  • Type

    jour

  • DOI
    10.1109/LMWC.2013.2279117
  • Filename
    6590030