Title :
Factory cycle-time prediction with a data-mining approach
Author :
Backus, Phillip ; Janakiram, Mani ; Mowzoon, Shahin ; Runger, George C. ; Bhargava, Amit
Author_Institution :
Nissan North America, Gardenia, CA, USA
fDate :
5/1/2006 12:00:00 AM
Abstract :
An estimate of cycle time for a product in a factory is critical to semiconductor manufacturers (and in other industries) to assess customer due dates, schedule resources and actions for anticipated job completions, and to monitor the operation. Historical data can be used to learn a predictive model for cycle time based on measured and calculated process metrics (such as work-in-progress at specific operations, lot priority, product type, and so forth). Such a method is relatively easy to develop and maintain. Modern data mining algorithms are used to develop nonlinear predictors applicable to the majority of process lots, and three methods are compared here. They are compared with respect to performance in actual manufacturing data (to predict times for both final and intermediate steps) and for the feasibility to maintain and rebuild the model.
Keywords :
data mining; job shop scheduling; semiconductor device manufacture; data mining; factory cycle-time prediction; historical data; nonlinear predictors; predictive model; statistical models; work-in-progress scheduling; Computational modeling; Data mining; Job shop scheduling; Manufacturing industries; Manufacturing processes; Predictive models; Production facilities; Semiconductor device manufacture; Statistical analysis; Virtual manufacturing; Due date; scheduling; statistical models; work-in-progress (WIP);
Journal_Title :
Semiconductor Manufacturing, IEEE Transactions on
DOI :
10.1109/TSM.2006.873400