Title :
Model requirements for simulation of low-voltage MOSFET in automotive applications
Author :
Buttay, Cyril ; Morel, Hervé ; Allard, Bruno ; Lefranc, Pierre ; Brevet, Olivier
Author_Institution :
Electr. Machines & Drives Res. Team, Univ. of Sheffield
fDate :
5/1/2006 12:00:00 AM
Abstract :
This paper focuses on the modeling of low-voltage automotive power electronic circuits to obtain accurate system simulation, including estimation of losses. The aim is to compare several metal-oxide semiconductor field-effect transistor (MOSFET) models to find out which can be used for low-voltage, high-current automotive converter simulations. As these models are intended for system simulation, only analytical models are addressed as they may be implemented into any circuit simulator. The different modes of operation of the switches are described (commutation, synchronous rectification, avalanche...), and several models of the power MOSFET transistor, allowing for simulation in these modes, are presented. Special care is given to the parameter extraction methods and to the interconnection model of the commutation cell. The four test circuits used to identify the low-voltage power MOSFET model parameters are presented. Comparison between simulations and measurements obtained with a calorimeter are then detailed. This measurement method is accurate and offers a simple way to prove the quality of simulation results. It is shown that the parameter identification is of major concern to achieve high accuracy, as classical Spice models can give good results, providing the model parameters are correctly set
Keywords :
automotive electronics; calorimeters; circuit testing; parameter estimation; power MOSFET; power convertors; automotive applications; commutation cell; low-voltage MOSFET; metal-oxide semiconductor field-effect transistor; parameter extraction method; parameter identification; power MOSFET; power electronic circuits; test circuits; Analytical models; Automotive applications; Automotive engineering; Circuit simulation; Circuit testing; MOS devices; MOSFET circuits; Power MOSFET; Power electronics; Power system modeling; Characterization; circuit parasitics; electrothermal; model; power metal-oxide semiconductor field-effect transistor (MOSFET); validation;
Journal_Title :
Power Electronics, IEEE Transactions on
DOI :
10.1109/TPEL.2006.872383