Title :
Comparison of noise-measured and theoretical value of base spreading resistance for an interdigitated transistor
Author :
Knott, K.F. ; Unwin, R.T.
Author_Institution :
University of Salford, Department of Electrical Engineering, Salford, UK
Abstract :
The base spreading resistance of a bipolar interdigitated transistor has been measured by a noise-measuring technique. The results compare favourably with calculation.
Keywords :
bipolar transistors; noise measurement; resistance (electric); base spreading resistance; bipolar interdigitated transistor; noise measuring technique;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19750112
