DocumentCode :
927691
Title :
Pseudonoise test signals and the fast Fourier transform
Author :
Wellstead, P.E.
Author_Institution :
UMIST, Control Systems Centre, Manchester, UK
Volume :
11
Issue :
10
fYear :
1975
Firstpage :
202
Lastpage :
203
Abstract :
Recent published work has indicated a growing interest in the combined use of periodic pseudonoise (p.n.) test signals and the fast Fourier transform (f.f.t.). However, it has been noted by Barker and Davy that the period of pseudonoise sequences are such that it is not possible to use the most efficient form of the f.f.t. This letter points out ways round the problem by drawing attention to a previously published result in this area. In addition, a little known algorithm that directly exploits the f.f.t. to generate pseudonoise is given.
Keywords :
fast Fourier transforms; identification; noise; fast Fourier transform; pseudonoise test signals;
fLanguage :
English
Journal_Title :
Electronics Letters
Publisher :
iet
ISSN :
0013-5194
Type :
jour
DOI :
10.1049/el:19750154
Filename :
4236669
Link To Document :
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