Title :
Thermally induced FM noise in Gunn oscillators and jitter in Gunn-effect digital devices
Author :
Tanimoto, M. ; Yanai, H. ; Sugeta, T.
Author_Institution :
University of Tokyo, Tokyo, Japan
Abstract :
By considering the fluctuation of the starting time of domain formation and that of domain formation time, an expression for thermally induced FM noise in Gunn oscillators is derived. The result is in good agreement with experimental data. These results are applied to estimate thermally induced jitter in Gunn-effect digital devices.
Keywords :
Circuit noise; Diodes; Fluctuations; Frequency; Gunn devices; Jitter; Noise level; Oscillators; Thermal resistance; Voltage;
Journal_Title :
Proceedings of the IEEE
DOI :
10.1109/PROC.1973.9215
