Title :
Built-in checking of the correct self-test signature
Author :
McAnney, W.H. ; Savir, J.
Author_Institution :
IBM Corp., Poughkeepsie, NY, USA
fDate :
9/1/1988 12:00:00 AM
Abstract :
A procedure is described for determining the initial value of a single or multiple input signature register (used to compress responses in built-in testing) so that the final good-machine signature is always constant, e.g. all zeros. In this way, it is possible to determine if a fault has been detected by ORing the outputs of the register stages. Since the OR operation can be built-in, a single observation of the output of the OR gate will determine if the circuit has passed the test
Keywords :
automatic testing; logic testing; built-in testing; initial value; self-test signature; signature register; single observation; Automatic testing; Built-in self-test; Circuit faults; Circuit testing; Fault detection; Feedback; Hardware; Polynomials; Shift registers; Strontium;
Journal_Title :
Computers, IEEE Transactions on