DocumentCode
928421
Title
Electron field emission from copper with various thicknesses of oxide film
Author
Heylen, A.E.D. ; Guile, A.E. ; Morgan, D.V.
Author_Institution
University of Leeds, Department of Electrical & Electronic Engineering, Leeds, UK
Volume
131
Issue
2
fYear
1984
fDate
3/1/1984 12:00:00 AM
Firstpage
111
Lastpage
117
Abstract
A new, nondestructive method for electron field emission measurement is presented, which, in principle, completely avoids the need for deleterious multiple sparking of the surface required by previous workers and which allows electron field emission to be measured at its origin; i.e. with only a few electrons leaving the cathodes per second. The results obtained on oxide-covered copper cathodes with various controlled thicknesses differ markedly from those obtained by previous workers and conform more with modern interpretation.
Keywords
copper; electron detection and measurement; electron field emission; oxide coated cathodes; Cu cathode; electron field emission measurement; nondestructive method; oxide coated cathode; oxide film;
fLanguage
English
Journal_Title
Physical Science, Measurement and Instrumentation, Management and Education - Reviews, IEE Proceedings A
Publisher
iet
ISSN
0143-702X
Type
jour
DOI
10.1049/ip-a-1.1984.0017
Filename
4646076
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