Title :
Fast Pass-Transistor Simulation for Custom MOS Circuits
Author :
Barzilai, Zeev ; Huisman, Leendert M. ; Silberman, Gabriel M. ; Tang, Donald T. ; Woo, Lin S.
Author_Institution :
IBM Thomas J. Watson Research Center
Abstract :
This approach uses the Yorktown Simulation Engine to bridge the gap between electrical and gate-level simulators. It is well-suited to fault simulation and design verification.
Keywords :
Analytical models; Circuit faults; Circuit simulation; Circuit testing; Communication switching; Logic design; MOS devices; Signal processing; Very large scale integration;
Journal_Title :
Design & Test of Computers, IEEE
DOI :
10.1109/MDT.1984.5005579
