Title :
Critical Path Tracing: An Alternative to Fault Simulation
Author :
Abramovici, Miron ; Menon, P.R. ; Miller, David T.
Author_Institution :
AT&T Bell Laboratories
Abstract :
Critical path tracing determines fault detection without explicit. fault simulation. It appears to be a more efficient alternative to conventional methods.
Keywords :
Circuit faults; Circuit simulation; Circuit testing; Combinational circuits; Computational modeling; Design for testability; Electrical fault detection; Fault detection; Fault diagnosis; Very large scale integration;
Journal_Title :
Design & Test of Computers, IEEE
DOI :
10.1109/MDT.1984.5005582
