• DocumentCode
    928886
  • Title

    Single-Crystal Germanium

  • Author

    Buehler, E.

  • Volume
    40
  • Issue
    8
  • fYear
    1952
  • Firstpage
    906
  • Lastpage
    909
  • Abstract
    Significant advances have been made in the development of new types of transistors, photocells, and rectifiers and in the improvement of the reproducibility and reliability of the point-contact transistor. A key factor in this development has been the use of single-crystal germanium having a high degree of lattice perfection and compositional control. Of particular interest to the device-development engineer is the fact that the rectifying barriers between the p-type and n-type sections behave in a manner predictable from the measured properties of each section. The exceptionally long lifetime of injected carriers observed in the material and the high degree of control over its chemical composition make it ideally suitable for the production of p-n structures. The ranges of properties of germanium single crystals which are now realizable are given, as well as their present degree of control.
  • Keywords
    Chemical products; Composite materials; Crystalline materials; Germanium; Lattices; Particle measurements; Rectifiers; Reliability engineering; Reproducibility of results; Transistors;
  • fLanguage
    English
  • Journal_Title
    Proceedings of the IRE
  • Publisher
    ieee
  • ISSN
    0096-8390
  • Type

    jour

  • DOI
    10.1109/JRPROC.1952.274096
  • Filename
    4051074