DocumentCode :
928905
Title :
Prototype Debug using ATE
Author :
Florcik, David ; Low, David ; Roche, Martin
Author_Institution :
Digital Equipment Corporation
Volume :
1
Issue :
2
fYear :
1984
fDate :
5/1/1984 12:00:00 AM
Firstpage :
94
Lastpage :
99
Abstract :
A less costly, less time-consuming method of design verification of printed circuit boards would permit a faster time-to-market in `today´s highly competitive marketplace. Digital Equipment´s staff devised a procedure that accelerates the process with ATE (using dynamic high-speed functional testing and a simulation pattern capturing process). This process also permits more rapid, more efficient, and more accurate fault isolation. For this method, the designer creates a hierarchical simulation scheme and writes design verfication tests. These tests are used to develop a test program for a prototype board. Interface signals for the next lower level of simulation must be modeled. The final simulation model must have all device-level interconnects modeled. (The level of automation determines the time required to produce a board test program.) This process emulates the final environment in which the board will be located and accomplishes a significant savings in time and cost.
Keywords :
Circuit faults; Circuit simulation; Circuit testing; Design methodology; Integrated circuit interconnections; Life estimation; Printed circuits; Prototypes; Time to market;
fLanguage :
English
Journal_Title :
Design & Test of Computers, IEEE
Publisher :
ieee
ISSN :
0740-7475
Type :
jour
DOI :
10.1109/MDT.1984.5005619
Filename :
5005619
Link To Document :
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