• DocumentCode
    929032
  • Title

    The low-temperature behavior of thyristors

  • Author

    Menhart, Steve ; Hudgins, Jerry L. ; Portnoy, William M.

  • Author_Institution
    Dept. of Eng. Technol., Arkansas Univ., Little Rock, AR, USA
  • Volume
    39
  • Issue
    4
  • fYear
    1992
  • fDate
    4/1/1992 12:00:00 AM
  • Firstpage
    1011
  • Lastpage
    1013
  • Abstract
    The forward breakover voltage and forward conduction voltage drop of a thyristor have been measured as a function of decreasing temperature between 25°C and -180°C. These data are presented for a 1200-V, 560-A average, inverter thyristor. Both the measured and calculated forward breakover voltages exhibit negative temperature coefficients. The decrease in VBF at low temperatures necessitates that thyristors with overrated blocking voltages be used at these temperatures
  • Keywords
    electric potential; invertors; semiconductor device testing; thyristors; -180 to 25 degC; 1200 V; 560 A; forward breakover voltage; forward conduction voltage drop; inverter thyristor; low-temperature behavior; negative temperature coefficients; overrated blocking voltages; thyristors; Doping; Joining processes; MOS capacitors; Notice of Violation; Pulse generation; Pulse measurements; Temperature; Thyristors; Transient response; Voltage;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/16.127497
  • Filename
    127497
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=929032