DocumentCode
929091
Title
An investigation of delta-I noise on integrated circuits
Author
Djordjevic, Antonije R. ; Sarkar, Tapan Kumar
Author_Institution
Dept. of Electr. Eng., Belgrade Univ., Yugoslavia
Volume
35
Issue
2
fYear
1993
fDate
5/1/1993 12:00:00 AM
Firstpage
134
Lastpage
147
Abstract
Delta-I noise is the voltage induced between the power conductors (e.g. the ground and the Vcc planes) when a circuit connected between them switches from one state to another. The authors show that the physics of the noise is more complex, and that it is related to wave propagation effects. Delta-I noise should be present not only in integrated circuits (chips), but also in multilayered boards, where it should be pronounced when the transients are of the order of 1 ns or less. Investigation of the delta-I noise is carried out for a simplified model of power planes, using a wire-antenna numerical simulation program. The model includes the wave propagation effects, as well as radiation, but it does not include the effects of the dielectric filling the space between the planes. The results of the analysis clearly show that the inductive effects are important only for slower transients. For fast digital circuits the power planes actually form a resonator,which can have a high quality factor, and the delta-I noise can build up to very high voltage levels.
Keywords
digital integrated circuits; electromagnetic compatibility; electron device noise; integrated circuits; printed circuits; transients; 1 ns; EM compatibility; EMC; IC; PCB; chips; delta-I noise; fast digital circuits; induced voltage transients; integrated circuit; multilayered boards; power conductors; power planes; printed circuit board; quality factor; radiation; resonator; wave propagation effects; wire-antenna numerical simulation; Circuit noise; Conductors; Dielectrics; Filling; Integrated circuit noise; Numerical simulation; Physics; Switches; Switching circuits; Voltage;
fLanguage
English
Journal_Title
Electromagnetic Compatibility, IEEE Transactions on
Publisher
ieee
ISSN
0018-9375
Type
jour
DOI
10.1109/15.229427
Filename
229427
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