Title :
Grain-size dependence of temperature coefficient of resistance of polycrystalline metal films
Author_Institution :
Central Electronics Engineering Research Institute, Pilani, India
Abstract :
The dependence of temperature coefficient of resistance of polycrystalline thin silver film on grain size diameter has been investigated theoretically. It has been found that it decreases with the decrease of grain size. For very small grain size, it is less than the bulk value and is negative in some cases, whereas for very large grain size it approaches the bulk value.
Keywords :
Eigenvalues and eigenfunctions; Equations; Grain size; Inorganic materials; Iterative methods; Laser theory; Masers; Optical films; Temperature dependence; Thermal resistance;
Journal_Title :
Proceedings of the IEEE
DOI :
10.1109/PROC.1973.9345
