DocumentCode :
929174
Title :
Modeling and analyzing vertical interconnections
Author :
Mäntysalo, Matti ; Ristolainen, Eero O.
Author_Institution :
Tampere Univ. of Technol., Finland
Volume :
29
Issue :
2
fYear :
2006
fDate :
5/1/2006 12:00:00 AM
Firstpage :
335
Lastpage :
342
Abstract :
Continual interest in miniaturization is driving electronic packaging toward three-dimensional (3-D) structures and system integration. Utilization of a third dimension allows designers much more freedom, but at the same time it leads to an increase in the complexity of signal routing. High-density of components and interconnection increases the need for electromagnetic (EM) modeling. This paper focuses on EM modeling and the analysis of vertical interconnection in a stacked 3-D package. Solder-plated polymer balls are used in vertical interconnection between interposers and laser-drilled vias through the interposers. High-frequency responses of the vertical interconnections were studied with 3-D full-wave software. Based on the EM analysis, we propose equivalent circuit models for vertical connections, which were verified with measurements. In addition, an impedance-matching technique in vertical interconnection is discussed.
Keywords :
equivalent circuits; impedance matching; integrated circuit interconnections; polymers; system-in-package; 3D full-wave software; EM analysis; EM model; electromagnetic model; equivalent circuit models; high-frequency responses; impedance-matching technique; solder-plated polymer balls; stacked 3-D package; vertical interconnections; Electromagnetic modeling; Electronics packaging; Equivalent circuits; Impedance; Integrated circuit interconnections; Laser modes; Lead; Polymers; Routing; Signal design; Electromagnetic (EM) modeling; system-in-package (SiP); three-dimensional (3-D) packaging; vertical interconnection;
fLanguage :
English
Journal_Title :
Advanced Packaging, IEEE Transactions on
Publisher :
ieee
ISSN :
1521-3323
Type :
jour
DOI :
10.1109/TADVP.2006.873137
Filename :
1629176
Link To Document :
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