DocumentCode :
929222
Title :
Further consideration of sample and feature size (Corresp.)
Author :
Young, Ian A.
Volume :
24
Issue :
6
fYear :
1978
fDate :
11/1/1978 12:00:00 AM
Firstpage :
773
Lastpage :
775
Abstract :
It is shown that in the context of a specific pattern classification decision metric the number of samples 
needed to characterize a cluster described by 
features is 
where 
represents an interval width. The distance metric 
is shown to have an 
-distribution which leads to the result for . An additional application of the distribution of 
is discussed in terms of a specific type of pattern classifier.
needed to characterize a cluster described by features is where represents an interval width. The distance metric is shown to have an -distribution which leads to the result for . An additional application of the distribution of is discussed in terms of a specific type of pattern classifier.Keywords :
Pattern classification; Adaptive arrays; Adaptive systems; Equations; Gaussian processes; Guidelines; Pattern recognition; Random processes; Signal to noise ratio; State estimation; Vectors;
fLanguage :
English
Journal_Title :
Information Theory, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9448
Type :
jour
DOI :
10.1109/TIT.1978.1055953
Filename :
1055953
Link To Document :
