• DocumentCode
    929292
  • Title

    A general approach to network analyzer calibration

  • Author

    Silvonen, Kimmo J.

  • Author_Institution
    Helsinki Univ. of Technol., Espoo, Finland
  • Volume
    40
  • Issue
    4
  • fYear
    1992
  • fDate
    4/1/1992 12:00:00 AM
  • Firstpage
    754
  • Lastpage
    759
  • Abstract
    A general-purpose algorithm, the TCX algorithm, for network analyzer and test fixture calibration is presented. The algorithm can handle most of the existing calibration methods, including symmetrical test fixtures. Any combination of one-port or two-port standards can be used. There is a possibility of partial self-calibration, if one of the standards is a two-port network or a through connection. The algorithm is applied to get simple equations covering the TSD, LDX (LRL), LAX, and LMX methods (X being an unknown one-port or symmetrical two-port network). A transmission path is allowed between the ports of standard X. In the TSD method, the delay line can be replaced with an attenuation network or with a matched load; also, the through line can have an unknown delay line and attenuation. A method of root choice for LRL and similar methods in conjunction with test fixtures is described. The method of least-squares-fit can be applied, when redundant data are available. It gives an essential improvement of accuracy in the simulation of a symmetrical test fixture
  • Keywords
    calibration; matrix algebra; network analysers; test equipment; LAX; LDX; LMX; LRL; TCX algorithm; TSD; attenuation network; calibration; general-purpose algorithm; least-squares-fit; matched load; network analyzer; one-port standards; partial self-calibration; symmetrical test fixtures; through connection; two-port standards; Attenuation; Calibration; Circuits; Delay lines; Equations; Filtering theory; Fixtures; Reflection; Scattering parameters; Testing;
  • fLanguage
    English
  • Journal_Title
    Microwave Theory and Techniques, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9480
  • Type

    jour

  • DOI
    10.1109/22.127526
  • Filename
    127526