DocumentCode :
929490
Title :
Erratum: Technique for plotting nonequilibrium C/V curves of an m.o.s. capacitor
Author :
Ole¿¿ski, J. ; Machalica, P.
Volume :
11
Issue :
17
fYear :
1975
Firstpage :
424
Keywords :
characteristics measurement; metal-insulator-semiconductor structures; semiconductor doping; XY recorder; gated amplifier; impurity profiles;
fLanguage :
English
Journal_Title :
Electronics Letters
Publisher :
iet
ISSN :
0013-5194
Type :
jour
DOI :
10.1049/el:19750326
Filename :
4236850
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=929490
